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Multielement trace determination in SiC powders: assessment of interlaboratory comparisons aimed at the validation and standardization of analytical procedures with direct solid sampling based on ETV ICP OES and DC arc OES

✍ Scribed by Ralf Matschat; Jürgen Haßler; Heike Traub; Angelika Dette


Publisher
Springer
Year
2005
Tongue
English
Weight
876 KB
Volume
383
Category
Article
ISSN
1618-2650

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