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Multideposition Multiroom-Temperature Annealing via Ultraviolet Ozone for HfZrO High- and Integration With a TiN Metal Gate in a Gate-Last Process

✍ Scribed by Ling Wu; HongYu Yu; Yew, K.S.; Jisheng Pan; Liu, W.J.; Tían Li Duan


Book ID
114620480
Publisher
IEEE
Year
2011
Tongue
English
Weight
755 KB
Volume
58
Category
Article
ISSN
0018-9383

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