Multi-scale strategy for high-k/metal-gate UTBB-FDSOI devices modeling with emphasis on back bias impact on mobility

✍ Scribed by Nier, O.; Rideau, D.; Niquet, Y. M.; Monsieur, F.; Nguyen, V. H.; Triozon, F.; Cros, A.; Clerc, R.; Barbé, J. C.; Palestri, P.; Esseni, D.; Duchemin, I.; Smith, L.; Silvestri, L.; Nallet, F.; Tavernier, C.; Jaouen, H.; Selmi, L.

• Book ID: 121594675
• Publisher: Springer
• Year: 2013
• Tongue: English
• Weight: 789 KB
• Volume: 12
• Category: Article
• ISSN: 1569-8025
• DOI: 10.1007/s10825-013-0532-1