Multi-scale analysis of engineering surfaces
โ Scribed by X. Chen; J. Raja; S. Simanapalli
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 545 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0890-6955
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โฆ Synopsis
Conventional surface characterization techniques involving random process analysis are limited in characterizing multiscale surface features relevant to manufacturing processes and functions. This paper introduces a novel technique for multi-scale characterization of engineering surfaces by applying wavelet lxansform. The main advantages of wavelet transform over other existing signal processing techniques are its space-frequency localization and multi-scale view of the components of a signal. Utilizing these properties of wavelet transform, we can effectively apply multi-channel filter banks to the surface data and link the manufacturing and functional aspects of a surface with its multi-scale features. Surfaces produced by typical manufacturing processes are analyzed using wavelet transform, and the usefulness of wavelet transform in the multi-scale analysis of engineering surfaces is demonstrated. I.
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