Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI–MOSFETs

✍ Scribed by A. Kumar; S. Mahapatra; R. Lal; V.R. Rao

• Book ID: 108361836
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 190 KB
• Volume: 41
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(01)00067-1