MP-A1 technology-induced nonconstant field scaling and its impact on submicro-meter device performance

✍ Scribed by Chatterjee, P.K.; Hunter, W.R.; Holloway, T.C.; Lin, Y.T.

• Book ID: 114593576
• Publisher: IEEE
• Year: 1980
• Tongue: English
• Weight: 158 KB
• Volume: 27
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1980.20176