MOVPE growth of (Al, Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy

✍ Scribed by K. Haberland; A. Bhattacharya; M. Zorn; M. Weyers; J. -T. Zettler; W. Richter

• Publisher: Springer US
• Year: 2000
• Tongue: English
• Weight: 185 KB
• Volume: 29
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-000-0102-8