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Moving Boundary Simulation and Experimental Verification of High Aspect-Ratio Through-Silicon-Vias for 3-D Integration

✍ Scribed by Chongshen Song; Zheyao Wang; Zhimin Tan; Litian Liu


Book ID
117913317
Publisher
Institute of Electrical and Electronics Engineers
Year
2012
Tongue
English
Weight
975 KB
Volume
2
Category
Article
ISSN
2156-3950

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