✦ LIBER ✦
MOSFET drain current reduction under Fowler–Nordheim and channel hot carrier injection before gate oxide breakdown
✍ Scribed by Simone Gerardin; Andrea Cester; Alessandro Paccagnella; Gabriella Ghidini
- Book ID
- 104064215
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 241 KB
- Volume
- 7
- Category
- Article
- ISSN
- 1369-8001
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