MOSFET degradation during substrate hot electron stress : S. P. Zhao, S. Taylor and A. McPhie. Microelectronics Journal, 25, 515 (1994)

• Book ID: 103287314
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 111 KB
• Volume: 36
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(96)81996-2