✦ LIBER ✦

MOS interface-state density measurements using transient capacitance spectroscopy

✍ Scribed by Wang, K.L.

Book ID: 114593654
Publisher: IEEE
Year: 1980
Tongue: English
Weight: 910 KB
Volume: 27
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1980.20257

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