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MOS-FET fabrication problems : Man Jin Kim, Solid-St. Electron. 12 (1969), p. 557

Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 104 KB
Volume: 9
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(70)90056-9

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Noise in junction- and MOS-FETs at high

Noise in junction- and MOS-FETs at high temperatures : A. van der Ziel, Solid-St. Electron. 12 (1969), p. 861

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 107 KB