✦ LIBER ✦
MOS capacitor holding time and diffusion length at DRAM refresh test temperature
✍ Scribed by Ammar Bouhdada; Jean Oualid
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 558 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2692
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