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MOS and Thyristor Damage Parameters after 2.5 and 15 MeV High Temperature Electron Irradiation

✍ Scribed by Fahrner, W. R. ;Bräunig, D. ;Borchert, E.


Publisher
John Wiley and Sons
Year
1982
Tongue
English
Weight
491 KB
Volume
72
Category
Article
ISSN
0031-8965

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