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Morphology of the subsurface layers of a Ti-Al-Mo-V alloy after carbonitriding

✍ Scribed by I. M. Pohrelyuk; O. I. Yas’kiv; V. M. Fedirko; O. M. Hrypachevs’kyi; R. V. Proskurnyak

Book ID
106455218
Publisher
Springer
Year
2006
Tongue
English
Weight
713 KB
Volume
42
Category
Article
ISSN
1573-885X

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High-energy and conventional X-ray photoelectron spectroscopy (XPS) with Cr K β (hn ϭ 5946.7 eV) and Al K α ( hn ϭ 1486.6 eV) radiation, respectively, were used to calculate the Auger parameters of Al, Ti and V in the Ti-Al ( Al ϭ 10, 20, 30 at%), Ti-35 at% Al-15 at% V, Ti-40 at% Al-20 at% V, Ti-25