Morphology of LiBr/LiF system studied by C-AFM

✍ Scribed by Mazur, P. ;Gołek, F.

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 158 KB
• Volume: 202
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200521257

✦ Synopsis

Abstract

In this work we investigate the growth of LiBr on LiF(100) by means of atomic force microscopy using its contact mode. To avoid electron or photon stimulated decomposition of the sample the substrate and the adlayer orientations were determined without use of any ionizing radiation. It is shown that LiBr deposited on the LiF(100) single crystal surface forms flat and well oriented layers. Furthermore, the LiBr layers being heated form rectangular and deep pits that open uncovered substrate areas. The edges of the pits are found to be par‐ allel to the substrate step edges ([100] and [010] directions). More effective heating enlarges the pits and rectangular patterns of nanobelts are formed. The average height of such belts is significantly larger than the initial thickness of the film indicating massive rearrangement of the deposited LiBr. The results give evidence of epitaxial growth of LiBr on the LiF(100) surface and clearly show that the LiBr adlayer orientation is intact with the substrate (i.e. the [100] LiBr axis is parallel to the substrate LiF [100] axis). (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)