## Abstract A standard solβgel method was used to deposit ZnO thin films of suitable thickness on glass substrate.The optical characteristics of the visible to infrared range on thermal stress were critically observed. Morphological signature of the films was detected by Xβray diffraction (XRD) an
Morphological, optical, and Raman characteristics of ZnO nanoflakes prepared via a sol-gel method
β Scribed by Kashif, M. ;Usman Ali, Syed M. ;Ali, M. E. ;Abdulgafour, H. I. ;Hashim, U. ;Willander, M. ;Hassan, Z.
- Book ID
- 105366594
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 309 KB
- Volume
- 209
- Category
- Article
- ISSN
- 0031-8965
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β¦ Synopsis
Abstract
Twoβdimensional (2D) ZnO nanoflakes were grown on thin aluminum layer, deposited on silicon substrate, using a solβgel method. The surface morphologies of ZnO nanoflakes at different precursor concentrations were studied using scanning electron microscopy (SEM). Combined studies of SEM, photoluminescence (PL), and Raman spectroscopy suggested that nanorods started to grow along with nanoflakes at a precursor concentration of 0.05βM and the density of the nanorods significantly increased when the concentration was raised to 0.075βM. Both the UVβluminescence and Raman spectra were intensified and redshifted with the increment of precursor concentration. Spectral intensification suggests improvement in crystal qualities and better optical properties of the fabricated ZnO nanostructures. The structural defects at lower levels of precursor were probably due to the hypoxic environment, whereas, the redshift of PL and Raman spectra was due to the local heating of ZnO nanocrystals.
π SIMILAR VOLUMES
In this work, ZnO thin films were prepared by sol-gel method and the effect of aging time of ZnO sol on the structural and optical properties of the films was studied. The structural characteristics of the samples were analyzed by an atomic force microscope and an X-ray diffractometer. The optical p