Morphological and structural characteriz
Morphological and structural characterizations of CrSi2 nanometric films deposited by laser ablation
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A.P. Caricato; G. Leggieri; A. Luches; F. Romano; G. Barucca; P. Mengucci; S.A.
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Article
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2007
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Elsevier Science
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English
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The structure and morphology of chromium disilicide (CrSi 2 ) nanometric films grown on h1 0 0i silicon substrates both at room temperature (RT) and at 740 K by pulsed laser ablation are reported. A pure CrSi 2 crystal target was ablated with a KrF excimer laser in vacuum ($3 ร 10 ร5 Pa). Morphologi