Monte Carlo study of two-dimensional electron gas transport in Si-MOS devices : Chu-Hao, J. Zimmermann, M. Chareff, R. Fauquembergue and E. Constant. Solid-St. Electron.28 (8) 733 (1985)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 123 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90184-8