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Monte Carlo study of remote Coulomb and remote surface roughness scattering in nanoscale Ge PMOSFETs with ultrathin high-κ dielectrics

✍ Scribed by Bahniman Ghosh; Jer-Hueih Chen; Xiao-Feng Fan; Leonard F. Register; Sanjay K. Banerjee


Book ID
108269521
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
162 KB
Volume
50
Category
Article
ISSN
0038-1101

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