Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch

✍ Scribed by Warren, Kevin M.; Sierawski, Brian D.; Reed, Robert A.; Weller, Robert A.; Carmichael, Carl; Lesea, Austin; Mendenhall, Marcus H.; Dodd, Paul E.; Schrimpf, Ron D.; Massengill, Lloyd W.; Hoang, Tan; Wan, Hsing; De Jong, J. L.; Padovani, Rick; Fabula, Joe J.

• Book ID: 121326487
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 847 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2007.907678