Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp
✦ LIBER ✦
Monolayer dispersion of MoO3, NiO and their precursors on γ-Al2O3
✍ Scribed by Xiaoyong Wang; Biying Zhao; De-en Jiang; Youchang Xie
- Book ID
- 108471958
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 139 KB
- Volume
- 188
- Category
- Article
- ISSN
- 0926-860X
No coin nor oath required. For personal study only.
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