Study of In2S3Thin Films by Diffraction
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V.G. Bessergenev; A.V. Bessergenev; E.N. Ivanova; Yu.A. Kovalevskaya
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Article
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1998
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Elsevier Science
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English
⚖ 257 KB
The crystal structure of In 2 S 3 thin films obtained by the chemical vapor deposition method from the volatile complex compounds indium(III) isopropyl xanthate and indium(III) diethyl dithiocarbonate was studied by synchrotron radiation diffraction. High photon beam intensity (3 ؋ 10 10 photons/mm