✦ LIBER ✦
Monitoring Potential Defects in an IGBT Module Based on Dynamic Changes of the Gate Current
✍ Scribed by Zhou, Shengqi; Zhou, Luowei; Sun, Pengju
- Book ID
- 118044824
- Publisher
- IEEE
- Year
- 2013
- Tongue
- English
- Weight
- 765 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0885-8993
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