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Molecular Screening and Resistance Evaluation of American Wheat Cultivars to Chinese Stripe Rust Races

✍ Scribed by Yu-lu BAI; Chun-yu ZHANG; Quan SUN; Feng LIN; Na CUI; Shi-chang XU; Yang GAO; Xiao-dan XU

Book ID: 118650945
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 426 KB
Volume: 9
Category: Article
ISSN: 1671-2927
DOI: 10.1016/s1671-2927(09)60237-6

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