Molecular Electronics at Metal/Semiconductor Junctions. Si Inversion by Sub-Nanometer Molecular Films

✍ Scribed by Yaffe, Omer; Scheres, Luc; Puniredd, Sreenivasa Reddy; Stein, Nir; Biller, Ariel; Lavan, Rotem Har; Shpaisman, Hagay; Zuilhof, Han; Haick, Hossam; Cahen, David; Vilan, Ayelet

• Book ID: 118000734
• Publisher: American Chemical Society
• Year: 2009
• Tongue: English
• Weight: 571 KB
• Volume: 9
• Category: Article
• ISSN: 1530-6984
• DOI: 10.1021/nl900953z