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Molecular effect of Al K α X-ray yields from aluminum oxide films for H+ and H+2 ion bombardments

✍ Scribed by A. Ootuka; F. Fujimoto; K. Komaki; K. Kawatsura; K. Ozawa; M. Terasawa


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
181 KB
Volume
97
Category
Article
ISSN
0375-9601

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