Sims differentiation of molecular and at
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M.A. Passler; A. Ignatiev; J.A. Schultz; J.Wayne Rabalais
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Article
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1981
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Elsevier Science
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English
โ 527 KB
A SI&fS investigation of adsorbed NO on Ni(OO1) at various temperatures that has been well characterized by LEED, XPS, UPS, and TDS has shown that the sputtered secondary ions do reflect the parent surface structure for selected primary beam parameters. Specifically, the molecular or atomic characte