𝔖 Bobbio Scriptorium
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Moisture induced package cracking in plastic encapsulated surface mount components during solder reflow process : R. Lin, E. Blackshear and P. Serisky. Proc. IEEE/IRPS, 83 (1988)


Book ID
103285685
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
266 KB
Volume
29
Category
Article
ISSN
0026-2714

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