Modification to the reduction technique of Thomas Case for obtaining a simplified reliability expression : K. K. Govil and R. A. Agarwala. Microelectron. Reliab.23 (5), 793 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 128 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90260-9