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Modification of the refractive index and the dielectric constant of silicon dioxide by means of ion implantation

✍ Scribed by J.W Swart; J.A Diniz; I Doi; M.A.B de Moraes


Book ID
114171683
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
167 KB
Volume
166-167
Category
Article
ISSN
0168-583X

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