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Modification of a commercial inductively coupled plasma atomic emission spectrometer for fast wavelength scanning by using a quartz refractor plate to measure background-corrected transient signals

✍ Scribed by P. Verrept; E. Courtijn; C. Vandecasteele; G. Windels; R. Dams


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
552 KB
Volume
257
Category
Article
ISSN
0003-2670

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