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Modern X-ray and optical systems for monitoring components in the atomic industry

✍ Scribed by P. I. Lavrenyuk; V. V. Rozhkov; Yu. K. Karlov; Yu. A. Zhukov; I. G. Chapaev; A. K. Potashnikov; Yu. V. Chugui

Publisher: Springer US
Year: 1998
Tongue: English
Weight: 759 KB
Volume: 85
Category: Article
ISSN: 1573-8205
DOI: 10.1007/bf02361110

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