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Modern methods for testing flatness with the application of electronics and computers

✍ Scribed by O. D. Bychkov


Book ID
118289028
Publisher
Springer US
Year
1968
Tongue
English
Weight
401 KB
Volume
11
Category
Article
ISSN
0543-1972

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## Abstract Significant improvements in calculational efficiency and capability with the self‐consistent electron pairs (SCEP) method has resulted from several new computational developments. A new procedure for constructing the important internal Coulomb and exchange operators has substantially re