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Models for reliability growth during burn-in: Theory and applications : K. W. Fertig and V. K. Murthy. Proc. IEEE A. Reliab. Maintainab. Symp., Los Angeles, 17–19 January 1978, p. 504

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 124 KB
Volume: 18
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90483-3

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