Models and experiments on degradation of oxidized silicon : C. T. Sah. Solid-St. Electron.33(2), 147 (1990)

• Book ID: 103286274
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 130 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90651-3