Analysis of Impedance and Noise Data of
Analysis of Impedance and Noise Data of an X-Ray Transition-Edge Sensor Using Complex Thermal Models
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M. R. J. Palosaari; K. M. Kinnunen; M. L. Ridder; J. vanΒ der Kuur; H. F. C. Hoev
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Article
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2012
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Springer US
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English
β 627 KB