✦ LIBER ✦
Modelling of surface roughness in variable-angle spectroscopic ellipsometry, using numerical processing of atomic force microscopy images
✍ Scribed by F.K. Urban III; P. Ruzakowski Athey; Md.S. Islam
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 587 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.