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Modelling of glitch measurement to determine instability issues in magnetoresistive devices

✍ Scribed by Xi, H.; Xu, B.; Loven, J.; Netzer, R.; Guzman, J.; Mao, S.


Book ID
114445307
Publisher
The Institution of Engineering and Technology
Year
2009
Tongue
English
Weight
152 KB
Volume
3
Category
Article
ISSN
1751-8822

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