✦ LIBER ✦
Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique
✍ Scribed by R. Dreesen; K. Croes; J. Manca; W. De Ceuninck; L. De Schepper; A. Pergoot; G. Groeseneken
- Book ID
- 108362430
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 437 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0026-2714
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