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Modeling validity of femtosecond laser breakdown in wide bandgap dielectrics

✍ Scribed by Xufeng Jing; Ying Tian; Junchao Zhang; Shunli Chen; Yunxia Jin; Jianda Shao; Zhengxiu Fan

Book ID: 116245029
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 847 KB
Volume: 258
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2012.01.070

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