Modeling the positive-feedback regenerative process of CMOS latchup by a positive transient pole method. II. Quantitative evaluation

✍ Scribed by Ming-Dou Ker; Chung-Yu Wu

• Book ID: 114536093
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 757 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.387250