Modeling semiconductor testing job scheduling and dynamic testing machine configuration

✍ Scribed by Jei-Zheng Wu; Chen-Fu Chien

• Book ID: 108127886
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 310 KB
• Volume: 35
• Category: Article
• ISSN: 0957-4174
• DOI: 10.1016/j.eswa.2007.07.026