Modeling of very high-frequency effects in the interconnection delays on GaAs-based VLSICs

✍ Scribed by A. K. Goel; S. E. Weitemeyer

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 144 KB
• Volume: 31
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.1404

✦ Synopsis

Abstract

In this paper, a model of the propagation delays in the interconnection lines on GaAs‐based very high‐speed integrated circuits is presented. The model includes the very high‐frequency effects, such as geometric dispersion, substrate losses, and conductor losses. The model is used to simulate the dependence of interconnect delays on the frequency of operation, interconnect length, width, material resistivity, load capacitance, and the driving source resistance. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 31: 229–233, 2001.