Modeling of Programming and Read Performance in Phase-Change Memories—Part II: Program Disturb and Mixed-Scaling Approach

✍ Scribed by Russo, U.; Ielmini, D.; Redaelli, A.; Lacaita, A.L.

• Book ID: 114619101
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 733 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.913573