Modeling of parasitic capacitances in deep submicrometer conventional and high-K dielectric MOS transistors

✍ Scribed by Mohapatra, N.R.; Desai, M.P.; Narendra, S.G.; Ramgopal Rao, V.

• Book ID: 114617030
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 565 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.811387