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Modeling of deep traps in diamond detectors by means of β particles-induced conductivity measurements

✍ Scribed by S. Lagomarsino; E. Borchi; R. D’Alessandro; S. Sciortino


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
333 KB
Volume
552
Category
Article
ISSN
0168-9002

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