Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method

✍ Scribed by Y. Shen; D.M. Barnett; P.M. Pinsky

• Book ID: 108122740
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 326 KB
• Volume: 32
• Category: Article
• ISSN: 0955-7997
• DOI: 10.1016/j.enganabound.2007.12.003