Modeling Defect Enhanced Detection at 1550 nm in Integrated Silicon Waveguide Photodetectors

✍ Scribed by Logan, D.F.; Jessop, P.E.; Knights, A.P.

• Book ID: 115372878
• Publisher: Optical Society of America
• Year: 2009
• Tongue: English
• Weight: 354 KB
• Volume: 27
• Category: Article
• ISSN: 0733-8724
• DOI: 10.1109/JLT.2008.927752