✦ LIBER ✦
Modeling charged defects, dopant diffusion and activation mechanisms for TCAD simulations using kinetic Monte Carlo
✍ Scribed by Ignacio Martin-Bragado; S. Tian; M. Johnson; P. Castrillo; R. Pinacho; J. Rubio; M. Jaraiz
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 553 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0168-583X
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